Angstrom Advanced AA5000 Multi-function SPM Systems

Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields

Introduction:

Angstrom Advanced AA5000 Scanning Probe Microscope is our most innovative model. Angstrom Advanced AA5000 features a full coverage of SPM techniques - STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing. AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, the Angstrom Advanced AA5000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA5000 SPM system.

AA5000 Features:

• Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM;
• Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode;
• SPM can be in liquid;
• Real-time temperature and humidity detecting;
• Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve;
• Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode;
• Fast automatic tip-engagement;
• Simple change of the tip holder to switch between STM and AFM;
• Full digital control, auto system status recognition;
• Adjustable lighting inside;
• 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion calculations per second can be achieved;
• Controller and Computer connected through a 10M/100M Fast Ethernet;
• Large sample size: up to a diameter of 45mm, 30mm thick;
• Online Control Software and offline Image Processing Software for Windows;
• Trace-Retrace scan, Back-Forward scan;
• Online real-time 3D imaging;
• Automatic Brightness and Contrast refresh;
• Data can be loaded out for further analysis;
• Nano-Movie function: Continuous data collection, storage and replay;
• Multi-Analysis: Granularity and Roughness;
• Tip Estimation and Image Re-construction;
• Modularized design for convenience of maintenance and future upgrade;
• Second display monitor and optical microscope system attachable;

Specifications:

Functions	Atomic Force Microscope (AFM) which has full coverage of Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode; Lateral Force Microscope (LFM); Scanning Tunneling Microscope (STM); Conductive AFM, SPM in liquid, Environmental Control SPM; Nano-Processing System including Lithography Mode and Vector Scan Mode;
Resolution	AFM: 0.26nm lateral, 0.1nm vertical; STM: 0.13nm lateral, 0.01nm vertical;
Technical Parameters	Current Sensitivity: less than or equal to 10pA; Force Sensitivity: less than or equal to 5pN; Image Pixels: 128X128, 256X256, 512X512, 1024X1024, 2048X2048; Scan Angle: 0-360 degree adjustable; Scan Rate: 0.1-100Hz adjustable; Pre-setting Tunneling Current: 0.001-10nA Bias: -10-+10V; Temperature Sensitivity: 0.1 Celsius, Humidity Sensitivity: 0.5%RH; Sample Size: Up to 50mmx50mm, 30mm thick; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm; Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x;
Electronics	CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; DAC: 20 channels of 16-bit DAC; ADC: 20 channels of 16-bit ADC; Communication Interface: 10M/100M Fast Ethernet;