An Angstrom Introduction to Atomic Force Microscopy
I don't need an introduction, just take me to your list of microscope products!
Atomic Force Microscopy is an advanced form of scanning probe microscopy capable of viewing and manipulating particles in a sample down to an atomic scale. The AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. The cantilever is a silicon or silicon nitride arm with a tip radius of curvature on the order of nanometers. When the tip is brought into proximity of a sample surface, forces between the tip and the sample lead to a deflection of the cantilever according to Hooke's law. Depending on the situation, forces that are measured in AFM include mechanical contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic forces, Casimir forces, solvation forces, etc.
Along with force, additional quantities may simultaneously be measured through the use of specialized types of probe. Typically, the deflection is measured using a laser spot reflected from the top surface of the cantilever into an array of photodiodes. Other methods that are used include optical interferometry, capacitive sensing or piezoresistive AFM cantilevers. These cantilevers are fabricated with piezoresistive elements that act as a strain gauge. Using a Wheatstone bridge, strain in the AFM cantilever due to deflection can be measured, but this method is not as sensitive as laser deflection or interferometry. The technology used in atomic force microscopy allows the devices to demonstrate resolutions up to 1000 times larger than the optical diffraction limit of a regular optical microscope.
What We Do at Angstrom Advanced Inc:
Angstrom Advanced Inc. offers a wide variety of atomic force microscopes (AFMs) to suit your research needs. Angstrom Advanced Inc. instruments are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have lead to the Angstrom Advanced Inc. AFMs leading the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staff provide premier service world wide to assist in much needed research.
The Angstrom Advanced line-up of atomic force microscopes includes technologies such as atomic force microscopy (AFM), scanning probe microscopy (SPM), scanning tunneling microscopy (STM), lateral force microscopy (LFM), and electric force microscopy (EFM). All Angstrom Advanced products bring state-of-the-art technology to meet virtually any laboratory application.
What We Don't Do:
AFM is technologically numerous steps beyond standard optical microscopy. Angstrom Advanced Inc. does not manufacture, supply, or distribute compound or biological binocular microscopes. You can find these types of microscopes by visiting www.microscopes.com.
Some Angstrom Advanced Inc. History:
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Learn more about specific Angstrom Advanced AFM systems and technology with our Tech Base: Atomic Force Microscopy page. Of course, you can also learn more about our AFM products by visiting our corporate website at www.angstrom-advanced.com and as always, contact us for quotations and to discuss your AFM needs. Whether it’s a basic AFM setup or a need for a full range multi-function SEM system, Angstrom Advanced has you covered.
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