Angstrom Advanced AA3000 Scanning Probe Microscope

Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields

Introduction:

Angstrom Advanced AA3000 Combined Scanning Force Microscope (SPM), Atomic Force microscope (AFM) and Lateral Force Microscope (LFM). Angstrom Advanced AA3000 is our most popular model. This unit is tailored towards research and industry applications, where the user is required to perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system.

Features:

• High Performance
  • Atomic-scale of resolution
  • Large sample size
  • DSP (Digital Signal Processing) for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer
• Multi-Function
  • Atomic Force Microscope (AFM)
  • Scanning Tunneling Microscope (STM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis
• Easy Operation
  • Fast automatic tip engagement
  • Easy change of the tip holder for simple switching between STM and AFM
  • Full digital control, auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades

Specifications:

Functions	Atomic Force Microscope (AFM) Scanning Tunneling Microscope (STM) Lateral Force Microscope (LFM)
Resolution	AFM: 0.26nm lateral, 0.1nm vertical Scanning Tunneling Microscope (STM)
Technical Parameters	X-Y scan scope:~10 micrometer Z distance:~2 micrometer Image Pixels: 128X128, 256X256, 512X512, 1024X1024 Scan Angle:0~360 degrees Scan Rate: 0.1~100Hz
Electronics	CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; Fast 16-bit DAC Fast 16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet
Mechanics	Sample Size: Up to 45mm in diameter, reaches 15mm when using a AA2000/AA3000, and reaches 30mm when using the AA5000 Engagement: Auto engagement with travel distance of 30mm and precision of 50nm
Software	Online control software and offline image processing software for Windows Vista/XP/2000/9x