Angstrom Advanced AFM/SEM/SPM Options

                       Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields                                                                                                                                                         

Probes: 1) Platinum-Iridium Probes for STM: Pt: 80%, Ir: 20%, Diameter: 0.25mm 2) Tungsten Probes for STM
Calibration Standards: 1) 1-D Standards 2) 2-D Standards 3) Step Height Standards 4) Tip Characterizer Standards
Scanners
Optical Microscope System
Vibration Isolation System 1) Size: 460 X 400 X 1060mm 2) Frequency: <0.55Hz vertical, <0.60Hz
Tip Holders: 1) STM Tip Holder 2) AFM/LFM Tip Holder 3) Tip Holders for other developments

Applications of Angstrom Advanced Atomic Force Microscopes

AA2000 Atomic Force Microscope (AFM)	Applied Physics Biosensor and Bioelectronics Chemistry Nanotechnology	High-resistance film observation Amperometric and cyclic voltammetric measurements Microstructure observation Electrochemical impedance measurements
AA3000 Scanning Probe Microscope (SPM)	Applied Physics Biosensor and Bioelectronics Nanotechnology	High-resistance film observation Amperometric and cyclic voltammetric measurements Microstructure observation Electrochemical impedance measurements
AA5000 Multi-function Scanning Probe Microscope(SPM) Systems	Biomaterial Electronic Communications Chemical and Materials Engineering Analytical Biochemistry	Characteristic study Surface morphology of the films Measure the conductivity Electrochemical detection
OS-AA Opening Multi-function Scanning Probe Microscope (SPM)	Biomaterial Electronic Communications Chemical and Materials Engineering Analytical Biochemistry Nanotechnology	Characteristic study Surface morphology of the films Measure the conductivity electrochemical detection Electrochemical impedance measurements

                    Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields                                                                                                                                                          

Angstrom Advanced AA8000 Multi-function SEM System

Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields

Introductions:

Angstrom Advanced AA8000 Multi-function SEM System is a true multi-purpose, multi-user instrument. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. This instrument features a perfect balance between stable configuration and an excellent resolution. Angstrom Advanced SEM models clearly show Angstrom’s state-of-art technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytic capability. Angstrom Advanced SEM pursues compact SEM design which is great for an office environment. Angstrom Advanced SEM provides high scan speed and pixel resolution and a high performance control driver with a new PCI board. A full set of automated image adjustment functions makes it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus. Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields. 

Features:

• High Performance
  • Field proven image quality
  • Upgraded scan speed and pixel resolution.
  • Wide variety of optional instrument
  • Resolution : 3.0 nm
  • Magnification : ~1,000,000X
  • Display : Photo 4096X 4096
  • Search : 640X480 30fps
  • Options : BSE / WDS / EDS / EBSD / Etc.
• Gun Column
  • Gun design for stable current supply
  • Dual field objective lens for spherical
  • Aberration reduction
  • Movable aperture for beam centering
  • Upgraded design of magnetic lens (CL/OL)
• Chamber & Stage
  • 5 axis eucentric stage
  • Option: Stage motorization
  • EDS,WDS,CCD, Manipulator etc
  • 50X60X57mm
• Detector
  • ET-bar type SE detector
  • SE & BSE double image mode
  • Option: BSE detector
• GUI
  • Window based GUI
  • PC controlled operation
  • Image thumbnail & storage
  • Parameter Display
• Vacuum System
  • Automatic & Manual control
  • Automatic Safety System
  • R.P+D.P/ R.P+TMP
• Image Analyzer
  • Data transfer to Excel
  • Particle counter for blob analysis
  • Multi-focusing & Tiling
  • 3D data view etc

Specifications:

Z ELECTRON OPTIC SYSTEM	Resolution 3.0 nm @30KeV SE/ 4.0nm @BSE Magnification 10 ~ 1,000,000X Image Color Optical Microscope Image (Option) Beam Scan Mode Search, Inspection, Photo (3step) Accelerating Voltage 0.5kV~30kV Electron Gun Type Tungsten Filament Bias System Linked with Acc. Voltage plus continuous voltage control Gun Alignment Pre-centered cartridge Condenser Lens Electromagnetic 2 stages Objective Lens Electromagnetic 1 stages Stigmator 8 Pole Electromagnetic Type Detector Bar Type SE Detector (SE-BSE Conversion Mode Without BSE detector for Non-coating sample inspection) Image Shift 4 Pole Electromagnetic Type Automation Function Auto-Focus, Auto-Stigmatism, Auto Contrast/Brightness, Emission Current etc.
DISPLAY	Frame Memory &Scan Search (640X480) >30 frame/sInspection (1280X960)  30 frame/sPhoto(4096X4096)  2 frame/s
IMAGE ANALYZER	Image Analyzer Particle Counter Multi-Focusing/ Image Tiling/ 3D-View/Enhancement/ Color Transformation/Filters/ Blob Analysis (Single/Multiple/Grouping), Histogram, Excel Data, Point Measurement
STAGE SYSTEM	Movement (X/Y/Z) mm 50/ 60/ 57mm Tilt -30~60° (Max 90 °) Rotation 360° Stage Motorization X,Y,R (Standard) X,Y,Z,Tilt,Rotation (Option)
VACUUM SYSTEM	Vacuum Control Type Full automation with safety system Vacuum System Rotary Pump + Diffusion Pump or Rotary Pump + Turbo Pump (Option)
CONTROL SYSTEM	Computer System Intel Pentium 4(Dual Co-Processor) Memory ≥ 256MB, Control Data Interface Operation System Image Acquisition

Angstrom Advanced OS-AA Multi-function Scanning Probe Microscope

With the best rates and a highly trained staff, we at Angstrom Advanced Inc. guarantee to meet your needs and work with you to obtain your project goals.

Introduction:

Angstrom Advanced Inc OS-AA Multi-function Scanning Probe Microscope system is known for its multi-functionality and full openness. Angstrom Advanced OS-AA system is not just a platform for unconventional experiments but also for further developments.

Features:

• Multi-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase;
• Imaging with Full digital control 16-bit ADC/DAC;
• High speed communication based on TCP/IP protocol for double-CPU-double-OS and large data-exchange;
• Input/output signal channel preserved for further system extension;
• Standard external open interface for second developments;
• I-V Curve and Force-Curve;
• Nano-Processing;
• Nano-manipulating with Super-Multimedia technology;
• Designed for Windows Vista/XP/NT/2000/9X;
• Hardcode and Dynamic Code both applied to offline software;
• Brightness and contrast auto refreshed;
• Multi-Analysis: Granularity and Roughness;

Specifications:

Resolution:	AFM: 0.26nm lateral, 0.1nm vertical; STM: 0.13nm lateral, 0.01nm vertical;
Current Sensitivity:	≤ 10pA
Force Sensitivity:	≤ 1nN
Positioning Accuracy:	≤ 0.5nm
Output channels preserved:	6ch (1ch ± 10V, 16-bit DAC)
Input channels preserved:	16ch (100k/16-bit ADC with Low-pass filter and amplifier)
DI/DO channels preserved:	8ch DI, 8ch DO

Angstrom Advanced AA5000 Multi-function SPM Systems

Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields

Introduction:

Angstrom Advanced AA5000 Scanning Probe Microscope is our most innovative model. Angstrom Advanced AA5000 features a full coverage of SPM techniques - STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing. AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, the Angstrom Advanced AA5000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA5000 SPM system.

AA5000 Features:

• Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM;
• Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode;
• SPM can be in liquid;
• Real-time temperature and humidity detecting;
• Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve;
• Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode;
• Fast automatic tip-engagement;
• Simple change of the tip holder to switch between STM and AFM;
• Full digital control, auto system status recognition;
• Adjustable lighting inside;
• 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion calculations per second can be achieved;
• Controller and Computer connected through a 10M/100M Fast Ethernet;
• Large sample size: up to a diameter of 45mm, 30mm thick;
• Online Control Software and offline Image Processing Software for Windows;
• Trace-Retrace scan, Back-Forward scan;
• Online real-time 3D imaging;
• Automatic Brightness and Contrast refresh;
• Data can be loaded out for further analysis;
• Nano-Movie function: Continuous data collection, storage and replay;
• Multi-Analysis: Granularity and Roughness;
• Tip Estimation and Image Re-construction;
• Modularized design for convenience of maintenance and future upgrade;
• Second display monitor and optical microscope system attachable;

Specifications:

Functions	Atomic Force Microscope (AFM) which has full coverage of Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode; Lateral Force Microscope (LFM); Scanning Tunneling Microscope (STM); Conductive AFM, SPM in liquid, Environmental Control SPM; Nano-Processing System including Lithography Mode and Vector Scan Mode;
Resolution	AFM: 0.26nm lateral, 0.1nm vertical; STM: 0.13nm lateral, 0.01nm vertical;
Technical Parameters	Current Sensitivity: less than or equal to 10pA; Force Sensitivity: less than or equal to 5pN; Image Pixels: 128X128, 256X256, 512X512, 1024X1024, 2048X2048; Scan Angle: 0-360 degree adjustable; Scan Rate: 0.1-100Hz adjustable; Pre-setting Tunneling Current: 0.001-10nA Bias: -10-+10V; Temperature Sensitivity: 0.1 Celsius, Humidity Sensitivity: 0.5%RH; Sample Size: Up to 50mmx50mm, 30mm thick; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm; Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x;
Electronics	CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; DAC: 20 channels of 16-bit DAC; ADC: 20 channels of 16-bit ADC; Communication Interface: 10M/100M Fast Ethernet;

Angstrom Advanced AA3000 Scanning Probe Microscope

Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields

Introduction:

Angstrom Advanced AA3000 Combined Scanning Force Microscope (SPM), Atomic Force microscope (AFM) and Lateral Force Microscope (LFM). Angstrom Advanced AA3000 is our most popular model. This unit is tailored towards research and industry applications, where the user is required to perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system.

Features:

• High Performance
  • Atomic-scale of resolution
  • Large sample size
  • DSP (Digital Signal Processing) for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer
• Multi-Function
  • Atomic Force Microscope (AFM)
  • Scanning Tunneling Microscope (STM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis
• Easy Operation
  • Fast automatic tip engagement
  • Easy change of the tip holder for simple switching between STM and AFM
  • Full digital control, auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades

Specifications:

Functions	Atomic Force Microscope (AFM) Scanning Tunneling Microscope (STM) Lateral Force Microscope (LFM)
Resolution	AFM: 0.26nm lateral, 0.1nm vertical Scanning Tunneling Microscope (STM)
Technical Parameters	X-Y scan scope:~10 micrometer Z distance:~2 micrometer Image Pixels: 128X128, 256X256, 512X512, 1024X1024 Scan Angle:0~360 degrees Scan Rate: 0.1~100Hz
Electronics	CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; Fast 16-bit DAC Fast 16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet
Mechanics	Sample Size: Up to 45mm in diameter, reaches 15mm when using a AA2000/AA3000, and reaches 30mm when using the AA5000 Engagement: Auto engagement with travel distance of 30mm and precision of 50nm
Software	Online control software and offline image processing software for Windows Vista/XP/2000/9x

Angstrom Advanced AA2000 Atomic Force Microscope

Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields

Introduction:

Angstrom Advanced AA2000 Combined Atomic Force Microscope (AFM) and Lateral Force Microscope (LFM)

Features:

• High Performance
  • Atomic-scale of resolution
  • Large sample size
  • DSP(Digital Signal Processing) for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer
• Multi-Function
  • Atomic Force Microscope (AFM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis
• Easy Operation
  • Fast automatically tip-engaging
  • Easy change of the tip holder for simple switching between STM and AFM
  • Full digital control; auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades

Specifications:

Functions	Atomic Force Microscope (AFM) Lateral Force Microscope (LFM)
Resolution	AFM: 0.26nm lateral, 0.1nm vertical
Technical Parameters	X-Y scan scope:~10 micrometer Z distance:~2 micrometer Image Pixels: 128X128, 256X256, 512X512, 1024X1024 Scan Angle: 0-360 degree Scan Rate: 0.1-100Hz
Electronics	CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; Fast 16-bit DAC Fast 16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet
Mechanics	Sample Size: Up to 45mm in diameter, reaches 15mm when using AA2000/AA3000, and reaches 30mm when using AA5000; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm
Software	Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x